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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/VrudhulaBS02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sarma_B._K._Vrudhula>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Supamas_Sirichotiyakul>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F513918.514085>
foaf:homepage <https://doi.org/10.1145/513918.514085>
dc:identifier DBLP conf/dac/VrudhulaBS02 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F513918.514085 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Estimation of the likelihood of capacitive coupling noise. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sarma_B._K._Vrudhula>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Supamas_Sirichotiyakul>
swrc:pages 653-658 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/VrudhulaBS02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/VrudhulaBS02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2002.html#VrudhulaBS02>
rdfs:seeAlso <https://doi.org/10.1145/513918.514085>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject deep submicron, noise, signal integrity (xsd:string)
dc:title Estimation of the likelihood of capacitive coupling noise. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document