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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/WeiweiX86>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weiwei_Mao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xieting_Ling>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F318013.318051>
foaf:homepage <https://doi.org/10.1145/318013.318051>
dc:identifier DBLP conf/dac/WeiweiX86 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F318013.318051 (xsd:string)
dcterms:issued 1986 (xsd:gYear)
rdfs:label Robust test generation algorithm for stuck-open fault in CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weiwei_Mao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xieting_Ling>
swrc:pages 236-242 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/1986>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/WeiweiX86/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/WeiweiX86>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac1986.html#WeiweiX86>
rdfs:seeAlso <https://doi.org/10.1145/318013.318051>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:title Robust test generation algorithm for stuck-open fault in CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document