Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/WenMSKOS07
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Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.
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Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.
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