Efficient compression and application of deterministic patterns in a logic BIST architecture.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/WohlWPA03
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2003
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Efficient compression and application of deterministic patterns in a logic BIST architecture.
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self-test (BIST), test-generation (ATPG)
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Efficient compression and application of deterministic patterns in a logic BIST architecture.
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