On fault modeling for dynamic MOS circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/dac/WunderlichR86>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Rosenstiel>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F318013.318100>
foaf:homepage	<https://doi.org/10.1145/318013.318100>
dc:identifier	DBLP conf/dac/WunderlichR86 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F318013.318100 (xsd:string)
dcterms:issued	1986 (xsd:gYear)
rdfs:label	On fault modeling for dynamic MOS circuits. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Rosenstiel>
swrc:pages	540-546 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/dac/1986>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/dac/WunderlichR86/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/dac/WunderlichR86>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/dac/dac1986.html#WunderlichR86>
rdfs:seeAlso	<https://doi.org/10.1145/318013.318100>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject	dynamic MOS, fault modeling, random testing, test pattern generation (xsd:string)
dc:title	On fault modeling for dynamic MOS circuits. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document