Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/YeLNC08
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2008
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Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness.
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SPICE simulation, atomistic simulations, line-edge roughness, non-rectangular gate, predictive modeling, random dopant fluctuations, threshold variation
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Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness.
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