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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dagm/ChoiPKCK03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byeong-Doo_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae-Young_Pyun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kang-Sun_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nam-Hyeong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sung-Jea_Ko>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-45243-0%5F59>
foaf:homepage <https://doi.org/10.1007/978-3-540-45243-0_59>
dc:identifier DBLP conf/dagm/ChoiPKCK03 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-540-45243-0%5F59 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Real-Time Inspection System for Printed Circuit Boards. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byeong-Doo_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae-Young_Pyun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kang-Sun_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nam-Hyeong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sung-Jea_Ko>
swrc:pages 458-465 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dagm/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dagm/ChoiPKCK03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dagm/ChoiPKCK03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dagm/dagm2003.html#ChoiPKCK03>
rdfs:seeAlso <https://doi.org/10.1007/978-3-540-45243-0_59>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dagm>
dc:title Real-Time Inspection System for Printed Circuit Boards. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document