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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dagm/LifshitsGRR04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ehud_Rivlin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Lifshits>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Rudzsky>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roman_Goldenberg>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-28649-3%5F64>
foaf:homepage <https://doi.org/10.1007/978-3-540-28649-3_64>
dc:identifier DBLP conf/dagm/LifshitsGRR04 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-540-28649-3%5F64 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Using Pattern Recognition for Self-Localization in Semiconductor Manufacturing Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ehud_Rivlin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Lifshits>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Rudzsky>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roman_Goldenberg>
swrc:pages 520-527 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dagm/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dagm/LifshitsGRR04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dagm/LifshitsGRR04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dagm/dagm2004.html#LifshitsGRR04>
rdfs:seeAlso <https://doi.org/10.1007/978-3-540-28649-3_64>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dagm>
dc:title Using Pattern Recognition for Self-Localization in Semiconductor Manufacturing Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document