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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/BiswasLBP05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Larry_T._Pileggi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peng_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sounil_Biswas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2005.277>
foaf:homepage <https://doi.org/10.1109/DATE.2005.277>
dc:identifier DBLP conf/date/BiswasLBP05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2005.277 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Specification Test Compaction for Analog Circuits and MEMS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Larry_T._Pileggi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peng_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sounil_Biswas>
swrc:pages 164-169 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/BiswasLBP05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/BiswasLBP05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2005.html#BiswasLBP05>
rdfs:seeAlso <https://doi.org/10.1109/DATE.2005.277>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Specification Test Compaction for Analog Circuits and MEMS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document