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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/ChengLHLCTWLCLL20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrew_Yi-Ann_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Shiun_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsing-Chung_Liang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ji-Wei_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Chau-Cheung_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leon_Chou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leon_Li-Yang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nova_Cheng-Yen_Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Yi-Yu_Liao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE48585.2020.9116546>
foaf:homepage <https://doi.org/10.23919/DATE48585.2020.9116546>
dc:identifier DBLP conf/date/ChengLHLCTWLCLL20 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE48585.2020.9116546 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrew_Yi-Ann_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Shiun_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsing-Chung_Liang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ji-Wei_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Chau-Cheung_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leon_Chou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leon_Li-Yang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nova_Cheng-Yen_Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Yi-Yu_Liao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
swrc:pages 1710-1711 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/ChengLHLCTWLCLL20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/ChengLHLCTWLCLL20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2020.html#ChengLHLCTWLCLL20>
rdfs:seeAlso <https://doi.org/10.23919/DATE48585.2020.9116546>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document