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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/ElfadelDKRS04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alina_Deutsch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bradley_Rubin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gerard_V._Kopcsay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Howard_H._Smith>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_M._Elfadel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2004.1269221>
foaf:homepage <https://doi.org/10.1109/DATE.2004.1269221>
dc:identifier DBLP conf/date/ElfadelDKRS04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2004.1269221 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label A CAD Methodology and Tool for the Characterization of Wide On-Chip Buses. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alina_Deutsch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bradley_Rubin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gerard_V._Kopcsay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Howard_H._Smith>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_M._Elfadel>
swrc:pages 144-149 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/ElfadelDKRS04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/ElfadelDKRS04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2004-df.html#ElfadelDKRS04>
rdfs:seeAlso <https://doi.org/10.1109/DATE.2004.1269221>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title A CAD Methodology and Tool for the Characterization of Wide On-Chip Buses. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document