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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/FazeliAMAT11>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahdi_Fazeli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehdi_Baradaran_Tahoori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seyed_Ghassem_Miremadi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seyed_Nematollah_Ahmadian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2011.5763020>
foaf:homepage <https://doi.org/10.1109/DATE.2011.5763020>
dc:identifier DBLP conf/date/FazeliAMAT11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2011.5763020 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hossein_Asadi_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahdi_Fazeli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehdi_Baradaran_Tahoori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seyed_Ghassem_Miremadi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seyed_Nematollah_Ahmadian>
swrc:pages 70-75 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2011.html#FazeliAMAT11>
rdfs:seeAlso <https://doi.org/10.1109/DATE.2011.5763020>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document