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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/GoelM03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_Kumar_Goel>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FDATE.2003.10171>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10171>
dc:identifier DBLP conf/date/GoelM03 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FDATE.2003.10171 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_Kumar_Goel>
swrc:pages 10738-10741 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/GoelM03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/GoelM03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2003.html#GoelM03>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10171>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document