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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/JenihhinHRKLSKH20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anton_Klotz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Sauer_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dan_Alexandrescu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geert_Jan_Schrijen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georgios_N._Selimis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_Nolte>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luca_Sterpone>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maksim_Jenihhin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_H%E2%88%9A%C4%BEbner_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Milos_Krstic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Langend%E2%88%9A%E2%88%82rfer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zoya_Dyka>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE48585.2020.9116558>
foaf:homepage <https://doi.org/10.23919/DATE48585.2020.9116558>
dc:identifier DBLP conf/date/JenihhinHRKLSKH20 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE48585.2020.9116558 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anton_Klotz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Sauer_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dan_Alexandrescu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geert_Jan_Schrijen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georgios_N._Selimis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_Nolte>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luca_Sterpone>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maksim_Jenihhin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_H%E2%88%9A%C4%BEbner_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Milos_Krstic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Langend%E2%88%9A%E2%88%82rfer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zoya_Dyka>
swrc:pages 388-393 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/JenihhinHRKLSKH20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/JenihhinHRKLSKH20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2020.html#JenihhinHRKLSKH20>
rdfs:seeAlso <https://doi.org/10.23919/DATE48585.2020.9116558>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document