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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/JoshiLBBG13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anne_Lombardot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edith_Beign%E2%88%9A%C2%A9>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marc_Belleville>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Smriti_Joshi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Girard>
foaf:homepage <http://dx.doi.org/doi.org%2F10.7873%2FDATE.2013.221>
foaf:homepage <https://doi.org/10.7873/DATE.2013.221>
dc:identifier DBLP conf/date/JoshiLBBG13 (xsd:string)
dc:identifier DOI doi.org%2F10.7873%2FDATE.2013.221 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anne_Lombardot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edith_Beign%E2%88%9A%C2%A9>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marc_Belleville>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Smriti_Joshi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Girard>
swrc:pages 1056-1057 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/JoshiLBBG13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/JoshiLBBG13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2013.html#JoshiLBBG13>
rdfs:seeAlso <https://doi.org/10.7873/DATE.2013.221>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document