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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/LiHCSWCCHL02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chi-Yi_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Pin_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chuang_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsiao-Ping_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsin-Jung_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeng-Bin_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shao-I_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2002.998317>
foaf:homepage <https://doi.org/10.1109/DATE.2002.998317>
dc:identifier DBLP conf/date/LiHCSWCCHL02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2002.998317 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label A Hierarchical Test Scheme for System-On-Chip Designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chi-Yi_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Pin_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chuang_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsiao-Ping_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsin-Jung_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeng-Bin_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shao-I_Chen>
swrc:pages 486-490 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/LiHCSWCCHL02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/LiHCSWCCHL02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2002.html#LiHCSWCCHL02>
rdfs:seeAlso <https://doi.org/10.1109/DATE.2002.998317>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title A Hierarchical Test Scheme for System-On-Chip Designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document