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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/LiuDSY07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Shang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_P._Dick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongpan_Liu>
foaf:homepage <http://dx.doi.org/10.1145%2F1266366.1266701>
foaf:homepage <https://dl.acm.org/citation.cfm?id=1266701>
dc:identifier DBLP conf/date/LiuDSY07 (xsd:string)
dc:identifier DOI 10.1145%2F1266366.1266701 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Accurate temperature-dependent integrated circuit leakage power estimation is easy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Shang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_P._Dick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongpan_Liu>
swrc:pages 1526-1531 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/LiuDSY07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/LiuDSY07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2007.html#LiuDSY07>
rdfs:seeAlso <https://dl.acm.org/citation.cfm?id=1266701>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Accurate temperature-dependent integrated circuit leakage power estimation is easy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document