[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/MathewSRSWW018>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carl_Christian_Rheinl%E2%88%9A%C2%A7nder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chirag_Sudarshan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Weis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Deepak_M._Mathew>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Martin_Schultheis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthias_Jung_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Norbert_Wehn>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE.2018.8342023>
foaf:homepage <https://doi.org/10.23919/DATE.2018.8342023>
dc:identifier DBLP conf/date/MathewSRSWW018 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE.2018.8342023 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label An analysis on retention error behavior and power consumption of recent DDR4 DRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carl_Christian_Rheinl%E2%88%9A%C2%A7nder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chirag_Sudarshan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Weis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Deepak_M._Mathew>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Martin_Schultheis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthias_Jung_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Norbert_Wehn>
swrc:pages 293-296 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/MathewSRSWW018/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/MathewSRSWW018>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2018.html#MathewSRSWW018>
rdfs:seeAlso <https://doi.org/10.23919/DATE.2018.8342023>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title An analysis on retention error behavior and power consumption of recent DDR4 DRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document