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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lizhou_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maksim_Jenihhin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE48585.2020.9116278>
foaf:homepage <https://doi.org/10.23919/DATE48585.2020.9116278>
dc:identifier DBLP conf/date/MedeirosGWFJTH20 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE48585.2020.9116278 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lizhou_Wu>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
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swrc:pages 792-797 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.23919/DATE48585.2020.9116278>
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dc:title A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document