[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/MukhopadhyayBR05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saibal_Mukhopadhyay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2005.210>
foaf:homepage <https://doi.org/10.1109/DATE.2005.210>
dc:identifier DBLP conf/date/MukhopadhyayBR05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2005.210 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saibal_Mukhopadhyay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
swrc:pages 224-229 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/MukhopadhyayBR05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/MukhopadhyayBR05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2005.html#MukhopadhyayBR05>
rdfs:seeAlso <https://doi.org/10.1109/DATE.2005.210>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document