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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/NabhanDRDS23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Baptiste_Rigaud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Luc_Danger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Max_Dutertre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Laurent_Sauvage>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roukoz_Nabhan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE56975.2023.10137124>
foaf:homepage <https://doi.org/10.23919/DATE56975.2023.10137124>
dc:identifier DBLP conf/date/NabhanDRDS23 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE56975.2023.10137124 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Baptiste_Rigaud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Luc_Danger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Max_Dutertre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Laurent_Sauvage>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roukoz_Nabhan>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/NabhanDRDS23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/NabhanDRDS23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2023.html#NabhanDRDS23>
rdfs:seeAlso <https://doi.org/10.23919/DATE56975.2023.10137124>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document