[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/PronathGA02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Helmut_E._Graeb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kurt_Antreich>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Pronath>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2002.998252>
foaf:homepage <https://doi.org/10.1109/DATE.2002.998252>
dc:identifier DBLP conf/date/PronathGA02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2002.998252 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Helmut_E._Graeb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kurt_Antreich>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Pronath>
swrc:pages 78-83 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/PronathGA02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/PronathGA02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2002.html#PronathGA02>
rdfs:seeAlso <https://doi.org/10.1109/DATE.2002.998252>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document