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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/RahajandraibeDACMC02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernard_Majoux>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruno_Cialdella>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Dufaza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Auvergne>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vivek_Chowdhury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenceslas_Rahajandraibe>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.2002.998291>
foaf:homepage <https://doi.org/10.1109/DATE.2002.998291>
dc:identifier DBLP conf/date/RahajandraibeDACMC02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.2002.998291 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernard_Majoux>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruno_Cialdella>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Dufaza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Auvergne>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vivek_Chowdhury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenceslas_Rahajandraibe>
swrc:pages 316-321 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2002>
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rdfs:seeAlso <https://doi.org/10.1109/DATE.2002.998291>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document