Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/date/SalivaCHFABBA15
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Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.
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Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.
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