CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/date/StopjakovaM97
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CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits.
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CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits.
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