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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/StopjakovaM97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_A._R._Manhaeve>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Viera_Stopjakov%E2%88%9A%C2%B0>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEDTC.1997.582369>
foaf:homepage <https://doi.org/10.1109/EDTC.1997.582369>
dc:identifier DBLP conf/date/StopjakovaM97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEDTC.1997.582369 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_A._R._Manhaeve>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Viera_Stopjakov%E2%88%9A%C2%B0>
swrc:pages 266-270 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/StopjakovaM97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/StopjakovaM97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/edtc1997.html#StopjakovaM97>
rdfs:seeAlso <https://doi.org/10.1109/EDTC.1997.582369>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document