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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/StrakaMVS98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Straka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_A._R._Manhaeve>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jozef_Vanneuville>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Svajda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDATE.1998.655904>
foaf:homepage <https://doi.org/10.1109/DATE.1998.655904>
dc:identifier DBLP conf/date/StrakaMVS98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDATE.1998.655904 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Straka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_A._R._Manhaeve>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jozef_Vanneuville>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Svajda>
swrc:pages 495-500 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/StrakaMVS98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/StrakaMVS98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date1998.html#StrakaMVS98>
rdfs:seeAlso <https://doi.org/10.1109/DATE.1998.655904>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:subject IDDQ, IDDQ monitors, testability, CMOS, integrated circuits, test hardware (xsd:string)
dc:title A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document