Analysis and Minimization of Test Time in a Combined BIST and External Test Approach.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/date/SugiharaYD00
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Analysis and Minimization of Test Time in a Combined BIST and External Test Approach.
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Analysis and Minimization of Test Time in a Combined BIST and External Test Approach.
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