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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/YeA0LP19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Z._Pan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Li_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Baker_Alawieh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Ye_0008>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yibo_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE.2019.8714960>
foaf:homepage <https://doi.org/10.23919/DATE.2019.8714960>
dc:identifier DBLP conf/date/YeA0LP19 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE.2019.8714960 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Z._Pan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Li_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Baker_Alawieh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Ye_0008>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yibo_Lin>
swrc:pages 54-59 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/YeA0LP19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/YeA0LP19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2019.html#YeA0LP19>
rdfs:seeAlso <https://doi.org/10.23919/DATE.2019.8714960>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document