[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/date/YuanTFXMKRCH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gouri_Sankar_Kar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanzhi_Xun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Couet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sicong_Yuan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sidharth_Rao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FDATE56975.2023.10137071>
foaf:homepage <https://doi.org/10.23919/DATE56975.2023.10137071>
dc:identifier DBLP conf/date/YuanTFXMKRCH23 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FDATE56975.2023.10137071 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Device-Aware Test for Back-Hopping Defects in STT-MRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gouri_Sankar_Kar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanzhi_Xun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Couet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sicong_Yuan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sidharth_Rao>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/date/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/date/YuanTFXMKRCH23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/date/YuanTFXMKRCH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/date/date2023.html#YuanTFXMKRCH23>
rdfs:seeAlso <https://doi.org/10.23919/DATE56975.2023.10137071>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/date>
dc:title Device-Aware Test for Back-Hopping Defects in STT-MRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document