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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dcis/ZhangYLM18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kexin_Yang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Linda_Milor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Zhang_0048>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taizhi_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDCIS.2018.8681492>
foaf:homepage <https://doi.org/10.1109/DCIS.2018.8681492>
dc:identifier DBLP conf/dcis/ZhangYLM18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDCIS.2018.8681492 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kexin_Yang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Linda_Milor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Zhang_0048>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taizhi_Liu>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dcis/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dcis/ZhangYLM18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dcis/ZhangYLM18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dcis/dcis2018.html#ZhangYLM18>
rdfs:seeAlso <https://doi.org/10.1109/DCIS.2018.8681492>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dcis>
dc:title Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document