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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ddecs/ChouardMFS11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Doris_Schmitt-Landsiedel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florian_Chouard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Fulde>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shailesh_More>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDDECS.2011.5783049>
foaf:homepage <https://doi.org/10.1109/DDECS.2011.5783049>
dc:identifier DBLP conf/ddecs/ChouardMFS11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDDECS.2011.5783049 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label An analog perspective on device reliability in 32nm high-őļ metal gate technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Doris_Schmitt-Landsiedel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florian_Chouard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Fulde>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shailesh_More>
swrc:pages 65-70 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ddecs/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ddecs/ChouardMFS11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ddecs/ChouardMFS11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ddecs/ddecs2011.html#ChouardMFS11>
rdfs:seeAlso <https://doi.org/10.1109/DDECS.2011.5783049>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ddecs>
dc:title An analog perspective on device reliability in 32nm high-őļ metal gate technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document