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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ddecs/EbrahimiK21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassan_Ebrahimi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDDECS52668.2021.9417064>
foaf:homepage <https://doi.org/10.1109/DDECS52668.2021.9417064>
dc:identifier DBLP conf/ddecs/EbrahimiK21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDDECS52668.2021.9417064 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassan_Ebrahimi>
swrc:pages 75-80 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ddecs/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ddecs/EbrahimiK21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ddecs/EbrahimiK21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ddecs/ddecs2021.html#EbrahimiK21>
rdfs:seeAlso <https://doi.org/10.1109/DDECS52668.2021.9417064>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ddecs>
dc:title Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document