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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ddecs/GyepesABS12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Arbet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%B0bor_Gyepes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juraj_Brenkus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Viera_Stopjakov%E2%88%9A%C2%B0>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDDECS.2012.6219046>
foaf:homepage <https://doi.org/10.1109/DDECS.2012.6219046>
dc:identifier DBLP conf/ddecs/GyepesABS12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDDECS.2012.6219046 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label Application of IDDT test towards increasing SRAM reliability in nanometer technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Arbet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%B0bor_Gyepes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juraj_Brenkus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Viera_Stopjakov%E2%88%9A%C2%B0>
swrc:pages 167-170 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ddecs/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ddecs/GyepesABS12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ddecs/GyepesABS12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ddecs/ddecs2012.html#GyepesABS12>
rdfs:seeAlso <https://doi.org/10.1109/DDECS.2012.6219046>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ddecs>
dc:title Application of IDDT test towards increasing SRAM reliability in nanometer technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document