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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ddecs/KoalUEV13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Markus_Ulbricht_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tobias_Koal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDDECS.2013.6549814>
foaf:homepage <https://doi.org/10.1109/DDECS.2013.6549814>
dc:identifier DBLP conf/ddecs/KoalUEV13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDDECS.2013.6549814 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label On the feasibility of combining on-line-test and self repair for logic circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Markus_Ulbricht_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tobias_Koal>
swrc:pages 187-192 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ddecs/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ddecs/KoalUEV13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ddecs/KoalUEV13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ddecs/ddecs2013.html#KoalUEV13>
rdfs:seeAlso <https://doi.org/10.1109/DDECS.2013.6549814>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ddecs>
dc:title On the feasibility of combining on-line-test and self repair for logic circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document