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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ddecs/Wen09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yun-Che_Wen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDDECS.2009.5012113>
foaf:homepage <https://doi.org/10.1109/DDECS.2009.5012113>
dc:identifier DBLP conf/ddecs/Wen09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDDECS.2009.5012113 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Test scheme for switched-capacitor circuits by digital analyses. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yun-Che_Wen>
swrc:pages 132-135 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ddecs/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ddecs/Wen09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ddecs/Wen09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ddecs/ddecs2009.html#Wen09>
rdfs:seeAlso <https://doi.org/10.1109/DDECS.2009.5012113>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ddecs>
dc:title Test scheme for switched-capacitor circuits by digital analyses. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document