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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ddecs/ZhangF06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guoyan_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ronan_Farrell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDDECS.2006.1649582>
foaf:homepage <https://doi.org/10.1109/DDECS.2006.1649582>
dc:identifier DBLP conf/ddecs/ZhangF06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDDECS.2006.1649582 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guoyan_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ronan_Farrell>
swrc:pages 89-90 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ddecs/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ddecs/ZhangF06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ddecs/ZhangF06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ddecs/ddecs2006.html#ZhangF06>
rdfs:seeAlso <https://doi.org/10.1109/DDECS.2006.1649582>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ddecs>
dc:title Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document