Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/delta/BhattacharyaC02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Soumendu_Bhattacharya
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDELTA.2002.994583
>
foaf:
homepage
<
https://doi.org/10.1109/DELTA.2002.994583
>
dc:
identifier
DBLP conf/delta/BhattacharyaC02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDELTA.2002.994583
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
rdfs:
label
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Soumendu_Bhattacharya
>
swrc:
pages
25-32
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/delta/2002
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/delta/BhattacharyaC02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/delta/BhattacharyaC02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/delta/delta2002.html#BhattacharyaC02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DELTA.2002.994583
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/delta
>
dc:
subject
Wafer-probe Test, Assembled Package Test, Multivariate Adaptive Regression Splines, Genetic Algorithm
(xsd:string)
dc:
title
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document