Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/delta/ChengYK08
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2008
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Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction.
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design-for-testability, full scan testing, scan tree, routing complexity, test response data volume
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Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction.
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