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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/delta/InoueIYI10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideyuki_Ichihara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nobukazu_Izumi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoo_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuki_Yoshikawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDELTA.2010.52>
foaf:homepage <https://doi.org/10.1109/DELTA.2010.52>
dc:identifier DBLP conf/delta/InoueIYI10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDELTA.2010.52 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideyuki_Ichihara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nobukazu_Izumi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoo_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuki_Yoshikawa>
swrc:pages 345-349 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/delta/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/delta/InoueIYI10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/delta/InoueIYI10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/delta/delta2010.html#InoueIYI10>
rdfs:seeAlso <https://doi.org/10.1109/DELTA.2010.52>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/delta>
dc:subject acceptable faults, threshold test generation, error significance, PODEM, 5-valued logic (xsd:string)
dc:title A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document