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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/delta/Kian06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lew_Boon_Kian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDELTA.2006.85>
foaf:homepage <https://doi.org/10.1109/DELTA.2006.85>
dc:identifier DBLP conf/delta/Kian06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDELTA.2006.85 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Test Cost Saving and Challenges in the Implementation of x6 and x8 Parallel Testing on Freescale 16-bit HCS12 Micro-controller Product Family. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lew_Boon_Kian>
swrc:pages 74-82 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/delta/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/delta/Kian06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/delta/Kian06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/delta/delta2006.html#Kian06>
rdfs:seeAlso <https://doi.org/10.1109/DELTA.2006.85>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/delta>
dc:title Test Cost Saving and Challenges in the Implementation of x6 and x8 Parallel Testing on Freescale 16-bit HCS12 Micro-controller Product Family. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document