Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/delta/OoiKCD08
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2008
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Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
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burn-in, reliability, yield modelling, integrated circuits, wafer testing
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Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
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