Boundary Scan as a Test Solution in Microelectronics Curricula. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/delta/RucinskiD02>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Andrzej_Rucinski_0002>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Barbara_Dziurla-Rucinska>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FDELTA.2002.994617>
foaf:homepage	<https://doi.org/10.1109/DELTA.2002.994617>
dc:identifier	DBLP conf/delta/RucinskiD02 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FDELTA.2002.994617 (xsd:string)
dcterms:issued	2002 (xsd:gYear)
rdfs:label	Boundary Scan as a Test Solution in Microelectronics Curricula. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Andrzej_Rucinski_0002>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Barbara_Dziurla-Rucinska>
swrc:pages	214-218 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/delta/2002>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/delta/RucinskiD02/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/delta/RucinskiD02>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/delta/delta2002.html#RucinskiD02>
rdfs:seeAlso	<https://doi.org/10.1109/DELTA.2002.994617>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/delta>
dc:subject	Education, Boundary scan, IEEE 1149.4 standard (xsd:string)
dc:title	Boundary Scan as a Test Solution in Microelectronics Curricula. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document