Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/delta/YotsuyanagiHIIT02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ichimiya
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Taisuke_Iwakiri
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDELTA.2002.994656
>
foaf:
homepage
<
https://doi.org/10.1109/DELTA.2002.994656
>
dc:
identifier
DBLP conf/delta/YotsuyanagiHIIT02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDELTA.2002.994656
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
rdfs:
label
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ichimiya
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Taisuke_Iwakiri
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada
>
swrc:
pages
387-391
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/delta/2002
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/delta/YotsuyanagiHIIT02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/delta/YotsuyanagiHIIT02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/delta/delta2002.html#YotsuyanagiHIIT02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DELTA.2002.994656
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/delta
>
dc:
subject
open defects, supply current test, CMOS IC, time-variable electric field, test pattern generation
(xsd:string)
dc:
title
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document