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dc:identifier ISBN 0-8186-7107-6 (xsd:string)
swrc:isbn ISBN 0-8186-7107-6 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995 (xsd:string)
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dc:publisher IEEE Computer Society (xsd:string)
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dc:title 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995 (xsd:string)
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