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<http://dblp.uni-trier.de/rec/bibtex/conf/dft/2015>
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<https://ieeexplore.ieee.org/xpl/conhome/7304347/proceeding>
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dc:identifier
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DBLP conf/dft/2015
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ISBN 978-1-4799-8606-4
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ISBN 978-1-4799-8606-4
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dcterms:issued
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2015
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rdfs:label
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2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015
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dc:publisher
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IEEE Computer Society
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owl:sameAs
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rdfs:seeAlso
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<http://amazon.com/s/ref=nb_ss_gw?field-keywords=978-1-4799-8606-4>
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rdfs:seeAlso
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<https://ieeexplore.ieee.org/xpl/conhome/7304347/proceeding>
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swrc:series
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<https://dblp.l3s.de/d2r/resource/conferences/dft>
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dcterms:tableOfContent
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<http://dblp.uni-trier.de/db/conf/dft/dft2015.html>
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dc:title
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2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015
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dc:type
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