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<http://dblp.uni-trier.de/rec/bibtex/conf/dft/2023>
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<https://dblp.l3s.de/d2r/resource/authors/Alberto_Bosio>
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<https://dblp.l3s.de/d2r/resource/authors/Luca_Cassano>
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<https://dblp.l3s.de/d2r/resource/authors/Marcello_Traiola>
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<https://dblp.l3s.de/d2r/resource/authors/Mihalis_Psarakis>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Alberto_Bosio>
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<https://dblp.l3s.de/d2r/resource/authors/Luca_Cassano>
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<https://dblp.l3s.de/d2r/resource/authors/Marcello_Traiola>
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<https://dblp.l3s.de/d2r/resource/authors/Mihalis_Psarakis>
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1109%2FDFT59622.2023>
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<https://doi.org/10.1109/DFT59622.2023>
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DBLP conf/dft/2023
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dc:identifier
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DOI doi.org%2F10.1109%2FDFT59622.2023
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ISBN 979-8-3503-1500-4
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ISBN 979-8-3503-1500-4
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2023
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IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023
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dc:title
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IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023
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