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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/AarajNCK04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ali_Chehab>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anis_Nazer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ayman_I._Kayssi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Najwa_Aaraj>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FDFT.2004.62>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/DFT.2004.62>
dc:identifier DBLP conf/dft/AarajNCK04 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FDFT.2004.62 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Transient Current Testing of Dynamic CMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ali_Chehab>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anis_Nazer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ayman_I._Kayssi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Najwa_Aaraj>
swrc:pages 264-271 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/AarajNCK04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/AarajNCK04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2004.html#AarajNCK04>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/DFT.2004.62>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Transient Current Testing of Dynamic CMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document