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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/Al-KhaliliARHR98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C4%ABme_Rozon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dhamin_Al-Khalili>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Douglas_Racz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moazzem_Hossain>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saman_Adham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.1998.732154>
foaf:homepage <https://doi.org/10.1109/DFTVS.1998.732154>
dc:identifier DBLP conf/dft/Al-KhaliliARHR98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.1998.732154 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C4%ABme_Rozon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dhamin_Al-Khalili>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Douglas_Racz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moazzem_Hossain>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saman_Adham>
swrc:pages 84-92 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/Al-KhaliliARHR98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/Al-KhaliliARHR98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft1998.html#Al-KhaliliARHR98>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.1998.732154>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject Defect Analysis, CMOS Defect Modeling (xsd:string)
dc:title Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document