Efficient critical area estimation for arbitrary defect shapes.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dft/AllanW97
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1997
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Efficient critical area estimation for arbitrary defect shapes.
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integrated circuit yield; critical area estimation; arbitrary defect shapes; circular defects; elliptical defects; rod shaped defects; arbitrary shaped defects; Edinburgh Yield Estimator; EYE; Cadence layout editor; EYES; EYE-sampling tool; IC layout
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Efficient critical area estimation for arbitrary defect shapes.
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