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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/BarnettSN01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_S._Barnett>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Victor_P._Nelson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.2001.966749>
foaf:homepage <https://doi.org/10.1109/DFTVS.2001.966749>
dc:identifier DBLP conf/dft/BarnettSN01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.2001.966749 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_S._Barnett>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Victor_P._Nelson>
swrc:pages 29-38 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2001>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/BarnettSN01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/BarnettSN01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2001.html#BarnettSN01>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.2001.966749>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject burn-in, clustering, defects, defect tolerance, infant mortality, negative binomial distribution, redundancy, reliability, yield (xsd:string)
dc:title Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document